Website Undergoing Updates
We are in the process of redesigning our website. Some pages may be incomplete or outdated. Please bear with us during this transition.

You are here

Spectrophotometer Nanospec AFT 180

Metrology
North Cleanroom
1.7

Micro-spectrophotometer head can measure in wavelength range 480-790 nm.

Measurement performed in the black dot of the objective aperture image.

Measures within 400A to 40,000A film thickness.

Accuracy in +/-3nm with the Ellipsometer

Transparent film thickness measurement