Rigaku SmartLab Multipurpose θ /θ X-ray Diffraction System
–Single-element Bragg Brentano (powder) and parallel beam (single crystal) incident beam optics
–High-power (9kW) x-ray source for faster acquisition times, thin samples
–1D silicon strip x-ray detector for fast, medium-resolution RSMs and pole figures
–In-plane diffraction goniometer for ultra thin and 2D materials characterization
–Single goniometer configuration for XRR and XRD measurements
Safety Instructions (mandatory class OH 306 X-ray Safety,from Environmental Health and Safety)
Procedures (delivered during training)
Measurement (see graphs):
- Reciprocal Space Map
- x-ray Reflectivity
- Rocking Curves
- Pole Figures,
- Residual Stress
Upgraded features: high-power rotating anode and the goniometer to a high-resolution in-plane system for ultra thin and 2D materials measurement
Software Features:
•Automated alignment and guided measurement configuration with Rigaku Guidance data acquisition software
•Extended compositional/thickness simulation and analysis with Rigaku Global Fit software
•3D reciprocal space map & pole figure rendering with Rigaku 3D Explore software
•Direct comparison of diffraction data to powder diffraction library with >193,000 entries (ICSD), with Rigaku PDXL software